X-ray Particle Contaminant Analyzer EA8000
Name X-ray Particle Contaminant Analyzer EA8000
Type EA8000
Overview EA8000 enables rapid detection and elemental identification of metal particles approximately 20µm in diameter found in the electrode plates of fuel cells and lithium ion rechargeable batteries.
Metal particle contamination in electrode materials, separators of fuel cells, and lithium ion rechargeable batteries causes heat and fire and decreases battery capacity and lifetime. We announce the release of our newly developed X-ray metal particle inspection system for batteries.
Features 1. Only a few minutes to Detect Particles 20 µm in Diameter in Samples 250×200 mm
Conventional X-ray CT systems require about 10 hours to detect metal particles 20 µm in diameter in battery electrode plates 250×200 mm (about B4-size).
Hitachi High-Tech Science developed a new particle inspection technology, in combination with the X-ray transmission method, resulting in greatly reduced imaging time. Detection time can be reduced to 3 to 10 minutes, more than 100 times shorter than conventional times. 
2. Automatic Particle Detection by Image Processing
EA8000 conducts high-speed image processing and detects particle position automatically from whole area of high-speed captured X-Ray Image 250×200 mm.
3. Automatic Elemental Identification of the Detected Particle
Fluorescent X-ray mapping at the particle location and automatic elementalidentification can be performed.

4. Identification of Metal Particles in Battery Electrode plates
Elemental identification is performed automatically. Conventional instruments are able to identify metal particles that are about 20 µm in diameter only when the particles are on the surface of electrode plates. Signal from the metal particles is considered to be very small due to the absorption by the sample material themselves. Unique Focused X-ray Optics is able to identify elements in metal particles that are approximately 20 µm in diameter within electrode plates and organic films.
5. All-in-one Instrument for Higher Efficiency
Detection speed and metal contaminants identification can be done with much shorter time than conventional instruments. An X-ray imaging unit, fluorescent X-ray analyzer, and optical microscope are integrated into one system and linked to provide results automatically. The operator can obtain measurement results simply by placing samples, resulting in working efficiency.
Particle Size Down to 20 µm
Detection Time Approximately 3 to 10 minutes(imaging 250 × 200 mm)
Elemental Analysis Time Approximately 1 to 4 minutes per detection (subject to change depending on element and particle size)
Elements Atomic nos. 12 (Mg) to 92 (U)
Sample State Solid / Powder
Sample Size W250 × D200 mm
X-ray Tube Small Air-cooled X-ray tube
(XRF Analyzer) Voltage: 45 kV
  Current: 900 µA
X-ray Angle Bottom-up Irradiation
(XRF Analyzer)
Beam Size 30 µm
(XRF Analyzer)
Fluorescent X-ray Detector Vortex Si semiconductor detector (No liquid nitrogen required)
X-ray Tube Water-cooled X-ray tube
(X-ray transmission)
Transmitted X-ray Detector High resolution CCD (Air-cooled)
Sample Observation High resolution lens and CCD camera
Controller Desktop and 19" TFT monitor
Automatic Particle Analysis X-Ray Imaging, metal particle detection, and elemental identification can be performed automatically.
Particle Size Measurement Detected particle size (projected area) can be measured automatically using X-Ray Image.
Data Process Microsoft Excel, Microsoft Word
Safety Mechamism Door interlock, Crash protection, Instrument self-diagnosis
Power requirements AC200V to 240V ±10% Single Phase, 20A
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Main Office Location Taiwan - Hsinchu, Tainan / China - Shanghai, Changan
Addresso.No.46, Sianjheng 5th St., Jhubei City, Hsinchu County 302, Taiwan (R.O.C.)|Tel:+886-3-6560883|Fax: +886-3-6564486